Nanometer scale polarimetry studies using a near–field scanning optical microscope

Applied Optics

Volumn 37, Issue 1, 1998, Pages 84-92

  Mc Daniel, E B ^a   Mc Clain, S C ^b   Hsu, J W P ^a  

^a University of Virginia   (United States)

^b NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; BIREFRINGENCE; CRYSTAL DEFECTS; LIGHT MEASUREMENT; LIGHT MODULATION; LIGHT POLARIZATION; MICROSCOPES; OPTICAL PROPERTIES; OXIDES; PHOTOSENSITIVITY; POLARIMETERS; REFRACTIVE INDEX;

NANOMETER SCALE POLARIMETRY; NEAR FIELD SCANNING OPTICAL MICROSCOPE; OPTICAL ANISOTROPY;

OPTICAL MICROSCOPY;

EID: 0031674710     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.000084     Document Type: Article

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