Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope

Review of Scientific Instruments

Volumn 70, Issue 3, 1999, Pages 1735-1739

  Hong, J W ^a   Park, Sang Il ^a,b   Khim, Z G ^a  

^a Seoul National University   (South Korea)

^b PSIA Corporation   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000598015     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149660     Document Type: Article

References (14)

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