Piezoresponse scanning force microscopy: What quantitative information can we really get out of piezoresponse measurements on ferroelectric thin films

Integrated Ferroelectrics

Volumn 38, Issue 1-4, 2001, Pages 23-29

  Harnagea, Catalin ^a   Pignolet, Alain ^a   Alexe, Marin ^a   Hesse, Dietrich ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Electromechanical characterization; Ferroelectric domains; Piezoelectric tensor; Piezoresponse scanning force microscopy

Indexed keywords

AMPLITUDE MODULATION; ANISOTROPY; ATOMIC FORCE MICROSCOPY; ELECTROMAGNETIC WAVE POLARIZATION; SHEAR STRENGTH;

ELECTROMECHANICAL CHARACTERIZATION; FERROELECTRIC DOMAINS; PIEZOELECTRIC TENSORS; PIEZORESPONSE SCANNING FORCE MICROSCOPY;

FERROELECTRIC THIN FILMS;

EID: 0010253923     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580108016914     Document Type: Article

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