Scanning impedance microscopy of electroactive interfaces

Applied Physics Letters

Volumn 78, Issue 9, 2001, Pages 1306-1308

  Kalinin, Sergei V ^a   Bonnell, Dawn A ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001647698     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1350627     Document Type: Article

References (21)

1. S. Semancik and R. Cavicchi, Acc. Chem. Res. 31, 279 (1998).
2. A. Hagfeldt and M. Graetzel, Acc. Chem. Res. 33, 269 (2000).
3. In Principles of Electronic Ceramics, edited by L. L. Hench and J. K. West (Wiley Interscience, New York, 1990).
4. In Ceramic Materials for Electronics, edited by R. Buchanan (Dekker, New York, 1991).
5. In Electronic Ceramics: Properties, Devices and Applications, edited by L. M. Levinson (Dekker, New York, 1988).
6. In Impedance Microscopy: Emphasizing Solid Materials and Systems, edited by J. R. Macdonald (Wiley, New York, 1987).
7. B.-S. Hong, S. J. Ford, and T. O. Mason, Key Eng. Mater. 125-126, 163 (1997).
8. S. P. Jiang, J. G. Love, and S. P. S. Badwal, Key Eng. Mater. 125-126, 81 (1997).
9. N. S. Hari, P. Padmini, and T. R. N. Kutty, J. Mater. Sci.: Mater. Electron. 8, 15 (1997).
10. R. Waser and R. Hagenbeck, Acta Mater. 48, 797 (2000).
11. J. Fleig, S. Rodewald, and J. Maier, J. Appl. Phys. 87, 2372 (2000).
12. S. H. Kim, J. H. Suh, J. G. Park, and Yooho Kim, Jpn. J. Appl. Phys., Part 1 39, 1788 (2000).
13. A. S. Skapin, J. Jamnik, and S. Pejovnik, Solid State Ionics 133, 129 (2000).
14. J. H. Hwang, K. D. Johnson, T. O. Mason, and V. P. Dravid, Appl. Phys. Lett. 76, 2621 (2000).
15. S. Tanaka and K. Takahash, J. Eur. Ceram. Soc. 19, 727 (1999).
16. S. V. Kalinin and D. A. Bonnell, Phys. Rev. B 62, 10 419 (2000).
17. B. D. Huey and D. A. Bonnell, Appl. Phys. Lett. 76, 1012 (2000).
18. D. A. Bonnell and S. V. Kalinin, in Polycrystalline Semiconductors VI -Bulk Materials, Thin Films and Devices, Solid State Phenomena, edited by O. Bonnaud, T. Mohammed-Brahim, H. P. Strunk, and J. H. Werner (Scitech, Uettikon am See, Switzerland, to be published).
19. P. M. Chaikin and T. C. Lubensky, Principles of Condensed Matter Physics (Cambridge University Press, New York, 1997).
20. D. Sarid, Scanning Farce Microscopy (Oxford University Press, New York, 1991).
21. S. H. Kim, H. W. Seon, H. T. Kim, J. G. Park, Y. Kim, and J. D, Byun, Mater. Sci. Eng., B 56, 12 (1999).