Imaging of microwave permittivity, tunability, and damage recover in (Ba, Sr)TiO3 thin films

Applied Physics Letters

Volumn 75, Issue 20, 1999, Pages 3180-3182

  Steinhauer, D E ^a   Vlahacos, C P ^a   Wellstood, F C ^a   Anlage, Steven M ^a   Canedy, C ^b   Ramesh, R ^b   Stanishevsky, A ^c   Melngailis, J ^c  

^a Bldg 142   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001548799     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125270     Document Type: Article

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