Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy

Applied Physics Letters

Volumn 75, Issue 16, 1999, Pages 2435-2437

  Meoded, T ^a   Shikler, R ^a   Fried, N ^a   Rosenwaks, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000027781     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125039     Document Type: Article

References (13)

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