Imaging silicon by Atomic Force Microscopy with crystallographically oriented tips

Applied Physics A: Materials Science and Processing

Volumn 72, Issue 7, 2001, Pages

  Giessibl, F J ^a   Hembacher, S ^a   Bielefeldt, H ^a   Mannhart, J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243262632     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390100627     Document Type: Article

References (14)

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