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Volumn 35, Issue 5 B, 1996, Pages
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Observation of silicon surfaces using ultrahigh-vacuum noncontact atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
IMAGING TECHNIQUES;
PIEZOELECTRIC TRANSDUCERS;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING SILICON;
SURFACE STRUCTURE;
SURFACES;
VACUUM APPLICATIONS;
ATOMIC RESOLUTION LEVEL;
CONSTANT AMPLITUDE VOLTAGE;
CONTACT IMAGING;
FORCE GRADIENT;
NONCONTACT MODE;
SILICON SURFACES;
ULTRAHIGH VACUUM NONCONTACT ATOMIC FORCE MICROSCOPY;
ATOMIC FORCE MICROSCOPY;
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EID: 0030144679
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.35.l668 Document Type: Article |
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Times cited : (82)
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References (6)
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