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Volumn 414, Issue 6859, 2001, Pages 27-29
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The insulator uncovered
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONDUCTORS;
IMAGING TECHNIQUES;
MICROSCOPIC EXAMINATION;
STRUCTURES;
ELECTRIC INSULATORS;
NANOPARTICLE;
MICROSCOPY;
ATOMIC FORCE MICROSCOPY;
CONDUCTOR;
ELECTRON DIFFRACTION;
ELECTRONICS;
IMAGING SYSTEM;
MAGNETIC FIELD;
MICROSCOPY;
PRIORITY JOURNAL;
SCANNING TUNNELING MICROSCOPY;
SHORT SURVEY;
X RAY DIFFRACTION;
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EID: 0035499886
PISSN: 00280836
EISSN: None
Source Type: Journal
DOI: 10.1038/35102135 Document Type: Short Survey |
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Times cited : (9)
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References (9)
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