A scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures

Review of Scientific Instruments

Volumn 69, Issue 1, 1998, Pages 221-225

  Allers, W ^a   Schwarz, A ^a   Schwarz, U D ^a   Wiesendanger, R ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002231718     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148499     Document Type: Article

References (32)

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18. Built by Oxford Instruments, Oxford, UK.
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