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Volumn 82, Issue 3, 1997, Pages 980-984

Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000650299     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365936     Document Type: Article
Times cited : (164)

References (14)
  • 5
    • 36449002581 scopus 로고
    • J.-K. Leong and C. C. Williams, Appl. Phys. Lett. 66, 1432 (1995); S. R. Manalis, S. C. Minne, and C. F. Quate, Appl. Phys. Lett. 68, 871 (1996).
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 1432
    • Leong, J.-K.1    Williams, C.C.2
  • 8
    • 85033172387 scopus 로고    scopus 로고
    • TappingMode, TESP, NanoScope, and LiftMode are trademarks of Digital Instruments, Inc., Santa Barbara, CA
    • TappingMode, TESP, NanoScope, and LiftMode are trademarks of Digital Instruments, Inc., Santa Barbara, CA.
  • 9
    • 85033170922 scopus 로고    scopus 로고
    • Philadelphia, PA, October 14
    • The results contained in this article were previously presented by Hal Edwards and Walter Duncan in an oral presentation in session NS-MoM at American Vacuum Society National Symposium, Philadelphia, PA, October 14, 1996.
    • (1996) American Vacuum Society National Symposium
    • Edwards, H.1    Duncan, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.