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Volumn 140, Issue 3-4, 1999, Pages 327-332

Contrast mechanism in non-contact SFM imaging of ionic surfaces

Author keywords

61.16.Ch; 68.35.Bs; 78.55.Fv; 85.42+m; APN; Ionic crystals; Scanning force microscopy; Theory; Tip surface interaction

Indexed keywords


EID: 0000448780     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00549-2     Document Type: Article
Times cited : (29)

References (24)
  • 22
    • 0040806891 scopus 로고    scopus 로고
    • A.S. Foster, private communication.
    • A.S. Foster, private communication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.