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Volumn 140, Issue 3-4, 1999, Pages 327-332
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Contrast mechanism in non-contact SFM imaging of ionic surfaces
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Author keywords
61.16.Ch; 68.35.Bs; 78.55.Fv; 85.42+m; APN; Ionic crystals; Scanning force microscopy; Theory; Tip surface interaction
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Indexed keywords
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EID: 0000448780
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(98)00549-2 Document Type: Article |
Times cited : (29)
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References (24)
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