Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 4, 1996, Pages 2428-2431

  Güthner, Peter ^a  

^a Omicron Vakuumphysik GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039588422     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588873     Document Type: Article

References (11)

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