Measurement and interpretation of forces in the atomic force microscope

Probe Microscopy

Volumn 1, Issue 1, 1997, Pages 65-79

  Jarvis, S P ^a   Tokumoto, H ^a  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

Author keywords

Adhesion; AFM; Force Characteristics; Tip surface Interaction; True Atomic Resolution

Indexed keywords

ACCURACY; ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; FORCE; INSTRUMENTATION;

EID: 0031544074     PISSN: 1355185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (72)