High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope

Applied Physics Letters

Volumn 72, Issue 24, 1998, Pages 3154-3156

  Kitamura, Shin'ichi ^a   Iwatsuki, Masashi ^a  

^a JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000862043     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121577     Document Type: Article

References (9)

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