High resolution atomic force microscopic imaging of the Si(111)-(7 × 7) surface: Contribution of short-range force to the images

Physical Review Letters

Volumn 89, Issue 26, 2002, Pages

  Eguchi, Toyoaki ^a   Hasegawa, Y ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; ELECTRON IRRADIATION; NANOSTRUCTURED MATERIALS; STACKING FAULTS; SURFACE STRUCTURE; VAN DER WAALS FORCES;

COVALENT BOND; DANGLING BOND; DIMER-ADATOM-STACKING FAULT; ELECTRON BEAM BOMBARDMENT; HIGH RESOLUTION ATOMIC FORCE MICROSCOPY;

SILICON WAFERS;

EID: 4244094247     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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