Atomic resolution in dynamic force microscopy across steps on Si(111)7 × 7

Zeitschrift fur Physik B-Condensed Matter

Volumn 100, Issue 2, 1996, Pages 165-167

  Luthi R ^a   Meyer, E ^a   Bammerlin, M ^a   Baratoff, A ^a   Lehmann, T ^a   Howald, L ^a   Gerber, Ch ^b   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039588419     PISSN: 07223277     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002570050106     Document Type: Article

References (19)

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2. For an overview in force microscopy see: "Forces in Scanning Probe Methods", Eds. Güntherodt, H.-J., Anselmetti, D., Meyer, E., NATO ASI Series E: Applied Sciences vol. 286, Kluwer Academic publishers (1995)
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12. Ohlsson, O., NANOSENSORS GmbH, Aidlingen, Germany
13. The quality factor Q = f/Δf is determined from the thermal noise power spectrum, whereby Δf is the full width of the resonance peak at 1/√2th height
14. Albrecht, T.R., Grütter, P., Horne, D., Rugar, D.: J. Appl. Phys. 69, 668 (1991). Our FM-Detector has been built in a collaboration with OMICRON Vakuumphysik GmbH, Taunusslein, Germany
15. Meyer, E., Howald, L., Lüthi, R., Haefke, H., Rüetschi, M., Bonner, T., Overney, R.M., Frommer, J., Hofer, R., Güntherodt, H.-J., J. Vac. Sci. Technol. B 12, 2060 (1994)
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