Tapping-mode tuning fork force sensing for near-field scanning optical microscopy

Applied Physics Letters

Volumn 73, Issue 19, 1998, Pages 2724-2726

  Tsai, Din Ping ^a   Lu, Yuan Ying ^a  

^a NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; ATOMIC FORCE MICROSCOPY; ELECTRODES; OPTICAL FIBERS; POLYSTYRENES; SILICA; THIN FILMS;

DISTANCE CONTROL; NEAR FIELD SCANNING OPTICAL MICROSCOPY; TAPPING MODE TUNING FORK FORCE SENSING;

OPTICAL MICROSCOPY;

EID: 0032500989     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122558     Document Type: Article

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