Effect of microscopic nonconservative process on noncontact atomic force microscopy

Japanese journal of applied physics

Volumn 39, Issue 12 B, 2000, Pages

  Sasaki, Naruo ^a,b   Tsukada, Masaru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

PERTURBATION TECHNIQUES; Q FACTOR MEASUREMENT;

NONCONTACT ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 0034472390     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.l1334     Document Type: Article

References (13)