Atomic steps with tuning-fork-based noncontact atomic force microscopy

Applied Physics Letters

Volumn 75, Issue 11, 1999, Pages 1640-1642

  Rensen, W H J ^a   Van Hulst, N F ^a   Ruiter, A G T ^b   West, P E ^b  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b ThermoMicroscopes   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000153077     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124780     Document Type: Article

References (16)

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