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Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 3, 2002, Pages 354021-354026

Electrostatic forces in atomic force microscopy

(2) Law, B M a Rieutord, F b

a KANSAS STATE UNIVERSITY (United States)

b CEA GRENOBLE (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRICITY; MATHEMATICAL MODEL; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; THEORY;

EID: 0037101132 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.66.035402 Document Type: Article

Times cited : (99)

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