Stable operation mode for dynamic noncontact atomic force microscopy

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Ueyama, H ^a   Sugawara, Y ^a   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT REGIONS; EXCITATION MODE; FORCE INTERACTION; FREQUENCY SHIFT; NONCONTACT ATOMIC FORCE MICROSCOPY; REPULSIVE FORCES; SAMPLE SURFACE; SHARP TIP; STABLE OPERATION; VIBRATION AMPLITUDE; VIBRATION MODES;

ATOMIC FORCE MICROSCOPY;

VIBRATING CONVEYORS;

EID: 0000964221     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051149     Document Type: Article

References (10)

1. F.J. Giessibl: Science 267, 1451 (1995)
2. S. Kitamura, M. Iwatsuki: Jpn. J. Appl. Phys. 34, L145 (1995)
3. N. Nakagiri, M. Suzuki, K. Okiguchi, H. Sigemura: Surf. Sci. Lett. 373, L329 (1997)
4. Y. Sugawara, H. Ueyama, T. Uchihashi, M. Ohta, S.Morita, M. Suzuki, S. Mishima: Appl. Suf. Sci. 113/14, 364 (1997)
5. H. Ueyama, M. Ohta, Y. Sugawara, S. Morita: Jpn. J. Appl. Phys. 34, L1088 (1995)
6. Y. Sugawara, M. Ohta, H. Ueyama, S. Morita: Science 270, 1646 (1995)
7. T.R. Albrecht, P. Grütter, D. Horne, D. Rugar: J. Appl. Phys. 69, 668 (1991)
8. R. Lüthi, E. Meyer, M. Bammerlin, A. Baratoff, T. Lehmann, L. Howald, Ch. Gerber, H.-J. Güntherodt: Z. Phys. B 100, 165 (1996)
9. P. Güthner: J. Vac. Sci. Technol. B 14, 2428 (1996)
10. M. Ohta, Y. Sugawara, S. Morita, H. Nagaoka, S. Mishima, T. Okada: J. Vac. Sci. Technol. B 12, 1075 (1994)