Lateral-force measurements in dynamic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 16, 2002, Pages 1614031-1614034

  Pfeiffer, O ^a   Bennewitz, R ^a   Baratoff, A ^a   Meyer, E ^a   Grutter P ^b  

^a UNIVERSITY OF BASEL   (Switzerland)

^b MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ARTICLE; DYNAMICS; ENERGY; FEEDBACK SYSTEM; FORCE; MICROSCOPY; OSCILLATION; TECHNIQUE;

EID: 0001580776     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

1. Proceedings of the Third International Workshop on Noncontact Atomic Force Microscopy