High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork

Applied Physics Letters

Volumn 73, Issue 26, 1998, Pages 3956-3958

  Giessibl, Franz J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21944434990     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122948     Document Type: Review

References (20)

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18. When imaging with true atomic resolution, γ≈-30fN m is a typical value, see Table 1 in Ref. 17.
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