A method for in situ characterization of tip shape in ac-mode atomic force microscopy using electrostatic interaction

Journal of Applied Physics

Volumn 84, Issue 8, 1998, Pages 4060-4064

  Olsson, L ^a   Lin, N ^a   Yakimov, V ^a   Erlandsson, R ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001689001     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368618     Document Type: Article

References (16)

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