A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy

Applied Physics Letters

Volumn 78, Issue 1, 2001, Pages 123-125

  Giessibl, F J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001071771     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1335546     Document Type: Article

References (25)

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