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Volumn 291, Issue 5513, 2001, Pages 2561-2562
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You may squeeze the atoms but don't mangle the surface!
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCIUM FLUORIDE;
FLUORINE;
SILICON;
ATOM;
ATOMIC FORCE MICROSCOPY;
IMAGE QUALITY;
IMAGING SYSTEM;
MICROSCOPY;
MODEL;
PRIORITY JOURNAL;
SHORT SURVEY;
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EID: 0035970809
PISSN: 00368075
EISSN: None
Source Type: Journal
DOI: 10.1126/science.1060014 Document Type: Short Survey |
Times cited : (5)
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References (19)
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