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Review of Scientific Instruments

Volumn 70, Issue 6, 1999, Pages 2765-2768

A low-temperature dynamic mode scanning force microscope operating in high magnetic fields

(5) Rychen, J a Ihn, T a Studerus, P a Herrmann, A a Ensslin, K a

a ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000811029 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1149842 Document Type: Article

Times cited : (90)

References (15)

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