A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics

Surface Science

Volumn 440, Issue 3, 1999, Pages

  Bielefeldt, Hartmut ^a   Giessibl, Franz J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

Atomic force microscopy; Intermittent contact; Tapping mode

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTATIONAL METHODS; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; SUBSTRATES;

HERTZIAN FORCES; INTERMITTENT-CONTACT-MODE FORCE MICROSCOPY;

SURFACE PHENOMENA;

EID: 0033359979     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00861-4     Document Type: Article

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