메뉴 건너뛰기




Volumn 75, Issue 1-2, 2004, Pages 1-68

Patterning self-assembled monolayers

Author keywords

Atomic force microscopy (AFM); Dip pen nanolithography; Lithography resists; Microcontact printing; N Alkanethiols; Nanotechnology; Patterning thin films; Scanning tunneling microscopy (STM); Self assembled monolayer (SAM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; CORROSION PREVENTION; ELECTROCHEMISTRY; ELECTRODES; GOLD; LITHOGRAPHY; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SCANNING; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; SURFACE ACTIVE AGENTS; SURFACE CHEMISTRY; THIN FILMS; TRANSITION METALS;

EID: 2442600280     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.progsurf.2003.12.001     Document Type: Review
Times cited : (742)

References (293)
  • 151
    • 0003529082 scopus 로고
    • Introduction to scanning tunneling microscopy
    • New York: Oxford University Press
    • Chen C.J. Introduction to Scanning Tunneling Microscopy, Oxford Series in Optical and Imaging Sciences. 1993;Oxford University Press, New York.
    • (1993) Oxford Series in Optical and Imaging Sciences
    • Chen, C.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.