Chemical force microscopy

Annual Review of Materials Science

Volumn 27, Issue 1, 1997, Pages 381-421

  Noy, Aleksandr ^a   Vezenov, Dmitri V ^a   Lieber, Charles M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

Adhesion; Atomic force microscopy; Double layer; Force titration; Friction; Imaging; Self assembled monolayers; Surface free energy

Indexed keywords

ADHESION; CHEMICAL BONDS; FREE ENERGY; FRICTION; IMAGING TECHNIQUES; IONIZATION; MONOLAYERS; ORGANIC SOLVENTS; TITRATION;

DOUBLE LAYERED MATERIALS; FRICTIONAL FORCES;

ATOMIC FORCE MICROSCOPY;

EID: 0030683047     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.matsci.27.1.381     Document Type: Article

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