Scanning force microscopy: Application to nanoscale studies of ferroelectric domains

Integrated Ferroelectrics

Volumn 19, Issue 1-4, 1998, Pages 49-83

  Gruverman, Alexei ^a   Auciello, Orlando ^b   Tokumoto, Hiroshi ^c  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

Ferroelectric domains; Nanostructures; SFM; Thin films piezoelectricity

Indexed keywords

DIELECTRIC FILMS; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY; SINGLE CRYSTALS; THIN FILMS;

FERROELECTRIC DOMAINS; SCANNING FORCE MICROSCOPY (SFM);

FERROELECTRIC MATERIALS;

EID: 0032295995     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589808012695     Document Type: Article

References (56)

1. Binnig, G., Quate, C. F. and Gerber, Ch. (1986). Phys. Rev. Lett., 56, 930.
2. Sarid, D. (1991). Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces, Oxford Series in Optical and Imaging Sciences (University Press, Oxford, 1991); Sarid, D. and Elings, V., J. Vac. Sci. Technol., B9, 431.
3. Sarid, D. (1991). Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces, Oxford Series in Optical and Imaging Sciences (University Press, Oxford, 1991); Sarid, D. and Elings, V., J. Vac. Sci. Technol., B9, 431.
4. Wiesendanger, R., Scanning Probe Microscopy and Spectroscopy: Methods and Applications (University Press, Cambridge, 1994) p. 291.
5. Martin, Y., Williams, C. C. and Wickramasinghe, H. K. (1987). J. Appl. Phys., 61, 4723.
6. Saurenbach, F. and Terris, B. D. (1990). Appl. Phys. Lett., 56, 1703.
7. Luthi, R., Haefke, H., Gutmannsbauer, W., Meyer, E., Howald, L. and Guntherodt, H.-J. (1994). J. Vac. Sci. Technol., B12, 2451.
8. Luthi, R., Haefke, H., Meyer, K.-P., Howald, L. and Guntherodt, H.-J. (1993). J. Appl. Phys., 74, 7461.
9. Luthi, R., Meyer, E., Howald, L., Haefke, H., Anselmetti, D., Dreier, M., Ruetschi, M., Bonner, T., Overney, R. M., Frommer, J. and Guntherodt, H.-J. (1994). J. Vac. Sci. Technol., B12, 1673.
10. Eng, L. M., Friedrich, M., Fousek, J. and Gunter, P. (1996). Ferroelectrics, 186, 999.
11. Eng, L. M., Friedrich, M., Fousek, J. and Gunter, P. (1996). J. Vac. Sci. Technol., B14, 1191.
12. Stern, J. E., Terris, B. D., Mamin, H. J. and Rugar, D. (1988). Appl. Phys. Lett., 53, 2717.
13. Martin, Y., Abraham, D. W. and Wickramasinghe, H. K. (1988). Appl. Phys. Lett., 52, 1103.
14. Terris, B. D., Stern, J. E., Rugar, D. and Mamin, H. J. (1989). Phys. Rev. Lett., 63, 2669.
15. Terris, B. D., Stern, J. E., Rugar, D. and Mamin, H. J. (1990). J. Vac. Sci. Technol., A8, 374.
16. Fridkin, V. M., Photoferroelectrics (Springer-Verlag, Berlin, 1979).
17. Luthi, R., Haefke, H., Meyer, K.-P., Meyer, E., Howald, L. and Guntherodt, H.-J. (1993). Surf. Sci., 285, L498.
18. Bluhm, H., Wiesendanger, R. and Meyer, K.-P. (1996). J. Vac. Sci. Technol., B14, 1180.
19. Correia, A., Massanell, J., Garcia, N., Levanyuk, A. P., Zlatkin, A. and Przeslawski, A. (1996). J. Appl. Phys. Lett., 68, 2796.
20. Gruverman, A. L., Kolosov, O. V., Hatano, J., Takahashi, K., and Tokumoto, H. (1995). J. Vac. Sci. Technol., B13, 1095.
21. Bluhm, H., Schwarz, U. D., Meyer, K.-P. and Wiesendanger, R. (1995). Appl. Phys., A 61, 525.
22. Nakatani, N. (1979). Jpn. J. Appl. Phys., 18, 491.
23. Konstantinova, V. P. (1962). Kristallographiya, 7, 748.
24. Shur, V. Ya., Subbotin, A. L. and Kuminov, V. P. (1993). Ferroelectrics, 140, 101.
25. Jona, F. and Shirane, G., Ferroelectric Crystals (Pergamon Press, Oxford, 1962).
26. Sawada, A. and Abe, R. (1967). Jpn. J. Appl. Phys., 6, 699.
27. Bae, M.-K., Horiuchi, T., Hara, K., Ishibashi, Y. and Matsushige, K. (1994). Jpn. J. Appl. Phys., 33, 1390.
28. Hamazaki, S.-I., Shimizu, F., Kojima, S. and Takashige, M. (1995). J. Phys. Soc. Jpn., 64, 3660.
29. Gruverman, A. L., Hatano, J. and Tokumoto, H. (1997). Jpn. J. Appl. Phys., 36(4), 2207.
30. Forsberg, P. W. (1949). Phys. Rev., 76, 1187.
31. Pompe, W., Gong, X., Suo, Z. and Speck, J. S. (1993). J. Appl. Phys., 74, 6012.
32. Kwak, B. S., Erbil, A., Budaj, J. D., Chisholm, M. F., Boatner, L. A. and Wilkens, B. J. (1994). Phys. Rev., B49, 14 865.
33. Guthner, P. and Dransfeld, K. (1992). Appl. Phys. Lett., 61, 1137.
34. Franke, K., Besold, J., Haessler, W. and Seegebarth, C. (1994). Surf. Sci. Lett., 302, L283.
35. Gruverman, A. L., Auciello, O., Hatano, J. and Tokumoto, H. (1996). Ferroelectrics, 184, 11.
36. Gruverman, A. L., Auciello, O. and Tokumoto, H. J. (1996). J. Vac. Sci. Technol., B14, 602.
37. Birk, H., Glatz-Reichenbach, J., Jie, L., Schreck, E. and Dransfeld, K. (1991). J. Vac. Sci. Technol., B9, 1162.
38. Takata, K. (1996). J. Appl. Phys., 79, 134.
39. Franke, K. and Weihnacht, M. (1995). Ferroelectric Lett., 19, 25.
40. Burnham, N. A. and Colton, J. R., Scanning Tunneling Microscopy and Spectroscopy: Theory, Techniques and Applications, Edited by D. A. Bonnell (VCH Publishers, New York, 1993), p.202.
41. Haefke, H., Luthi, R., Meyer, K.-P. and Guntherodt, H.-J. (1994). Ferroelectrics, 151, 143.
42. Miller, R. C. and Weinreich, G. (1960). Phys. Rev., 117, 1460.
43. Gruverman, A. L., Auciello, O. and Tokumoto, H. (1996). Appl. Phys. Lett., 69, 3191.
44. Scott, J. F. and Paz de Araujo, C. A. (1989). Science, 246, 1400.
45. Hidaka, T., Maruyama, T., Saitoh, M., Mikoshiba, N., Shimizu, M., Shiosaki, T., Wills, L. A., Hiskes, R., Dicarolis, S. A. and Amano, J. (1996). Appl. Phys. Lett., 68, 2358.
46. Scott, J. F., Paz de Araujo, C. A. and Melnick, B. M. (1994). J. Alloys and Compounds, 211, 451.
47. Hase, T. and Shiosaki, T. (1990). Jpn. J. Appl. Phys., 24, 2159.
48. Ishibashi, Y. and Takagi, Y. (1971). J. Phys. Soc. Jpn., 31, 506.
49. Ishibashi, Y. (1986). Jpn. J. Appl. Phys., 24 (Suppl. 24-3), 126.
50. Auciello, O., Gruverman, A. L. and Tokumoto, H. (1997). Integrated Ferroelectrics, 15, 107.
51. Warren, W. L., Dimos, D., Tuttle, B. A., Pike, G. E., Schwartz, R. W., Clews, P. J. and McIntrye, D. C. (1995). J. Appl. Phys., 77, 6695.
52. Scott, J. F. and Pouligny, B. (1988). J. Appl. Phys., 64, 1547.
53. Mihara, T., Watanabe, H. and Paz de Araujo, C. A. (1994). J. Appl. Phys., 33, 5281.
54. Kholkin, A. L., Colla, E. L., Tagantsev, A. K., Taylor, D. V. and Setter, N. (1996). Appl. Phys. Lett., 68, 2577.
55. Seifert, A., Lange, F. F. and Speck, J. S. (1995). J. Mat. Res., 10, 680.
56. Franke, K. (1995). Ferroelectric Lett., 19, 35.