-
3
-
-
0342934173
-
-
Kardos, J. L.; Gadkaree, K. P.; Bhate, A. P.; Chiellini, E.; Giusti, P.; Migliaresi, C.; Nicolais, L. Polym. Sci. Technol. 1986, 34, 187.
-
(1986)
Polym. Sci. Technol.
, vol.34
, pp. 187
-
-
Kardos, J.L.1
Gadkaree, K.P.2
Bhate, A.P.3
Chiellini, E.4
Giusti, P.5
Migliaresi, C.6
Nicolais, L.7
-
4
-
-
0031947320
-
-
Xia, Y.; Whitesides, G. M. Angew. Chem., Int. Ed. 1998, 37, 550.
-
(1998)
Angew. Chem., Int. Ed.
, vol.37
, pp. 550
-
-
Xia, Y.1
Whitesides, G.M.2
-
15
-
-
0026889223
-
-
Wang, S.; Mark, J. E. J. Polym. Sci., B 1992, 30, 801.
-
(1992)
J. Polym. Sci., B
, vol.30
, pp. 801
-
-
Wang, S.1
Mark, J.E.2
-
17
-
-
0031552575
-
-
Delamarche, E.; Schmid, H.; Michel, B.; Biebuyck, H. Adv. Mater. 1997, 9, 741.
-
(1997)
Adv. Mater.
, vol.9
, pp. 741
-
-
Delamarche, E.1
Schmid, H.2
Michel, B.3
Biebuyck, H.4
-
19
-
-
0030653742
-
-
Biebuyck, H. A.; Larsen, N. B.; Delamarche, E.; Michel, B. IBM J. Res. Dev. 1997, 41, 159.
-
(1997)
IBM J. Res. Dev.
, vol.41
, pp. 159
-
-
Biebuyck, H.A.1
Larsen, N.B.2
Delamarche, E.3
Michel, B.4
-
21
-
-
0031683340
-
-
Rogers, J. A.; Paul, K. E.; Whitesides, G. M. J. Vac. Sci. Technol., B 1998, 16, 88.
-
(1998)
J. Vac. Sci. Technol., B
, vol.16
, pp. 88
-
-
Rogers, J.A.1
Paul, K.E.2
Whitesides, G.M.3
-
24
-
-
0342499984
-
-
For more information about the surface hardness measurement see http://www.zurich.ibm.com/technologies/conprint/ tools.
-
-
-
-
26
-
-
0343805245
-
-
For more information about Sylgard 184 see http://www. zurich.ibm.com/technologies/conprint/sylgard.
-
-
-
-
27
-
-
0342934158
-
-
Tables for Figure 1 available at: http://www.zurich.ibm.com/ technologies/conprint/table.
-
-
-
-
28
-
-
0028424955
-
-
Sharaf, M. A.; Mark, J. E.; Ahmed, E. Colloid Polym. Sci. 1995, 272, 504.
-
(1995)
Colloid Polym. Sci.
, vol.272
, pp. 504
-
-
Sharaf, M.A.1
Mark, J.E.2
Ahmed, E.3
-
33
-
-
0343369598
-
-
Wang, P.; Guo, J.; Wunder, S. L. J. Polym. Sci, B 1997, 35, 2391.
-
(1997)
J. Polym. Sci, B
, vol.35
, pp. 2391
-
-
Wang, P.1
Guo, J.2
Wunder, S.L.3
-
34
-
-
0001565068
-
-
Delamarche, E.; Schmid, H.; Bietsch, A.; Larsen, N. B.; Rothuizen, H.; Michel, B.; Biebuyck, H. A. J. Phys. Chem. 1998, 102, 3324.
-
(1998)
J. Phys. Chem.
, vol.102
, pp. 3324
-
-
Delamarche, E.1
Schmid, H.2
Bietsch, A.3
Larsen, N.B.4
Rothuizen, H.5
Michel, B.6
Biebuyck, H.A.7
-
35
-
-
0032050524
-
-
Bernard, A.; Delamarche, E.; Schmid, H.; Michel, B.; Bosshard, H. R.; Biebuyck, H. Langmuir 1998, 14, 2225.
-
(1998)
Langmuir
, vol.14
, pp. 2225
-
-
Bernard, A.1
Delamarche, E.2
Schmid, H.3
Michel, B.4
Bosshard, H.R.5
Biebuyck, H.6
-
36
-
-
0032073945
-
-
Schmid, H.; Biebuyck, H.; Michel, B. Appl. Phys. Lett. 1998, 72, 2379.
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 2379
-
-
Schmid, H.1
Biebuyck, H.2
Michel, B.3
|