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Volumn 394, Issue 6696, 1998, Pages 868-871

Controlling local disorder in self-assembled monolayers by patterning the topography of their metallic supports

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ELECTRONICS; PRIORITY JOURNAL; SEMICONDUCTOR; STRUCTURE ANALYSIS;

EID: 0032572756     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/29730     Document Type: Article
Times cited : (187)

References (26)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.