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Advanced Materials

Volumn 14, Issue 8, 2002, Pages 572-577

Controlled cluster size in patterned particle arrays via directed adsorption on confined surfaces

(4) Lee, I a Zheng, H a Rubner, M F a Hammond, P T a

a Massachusetts Institute of Technology Cambridge (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; MULTILAYERS; PARTICLE SIZE ANALYSIS; POLYELECTROLYTES; SELF ASSEMBLY; SURFACES;

COLLOIDAL PARTICLE ARRAYS;

COLLOIDS;

EID: 0037129275 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/1521-4095(20020418)14:8<572::AID-ADMA572>3.0.CO;2-B Document Type: Article

Times cited : (146)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.