Characterization of the surface to thiol bonding in self-assembled monolayer films of C12H25SH on InP(100) by angle-resolved X-ray photoelectron spectroscopy

Langmuir

Volumn 15, Issue 25, 1999, Pages 8640-8644

  Yamamoto, Hiromichi ^a   Butera, R A ^a   Gu, Y ^a   Waldeck, David H ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000052692     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la990467r     Document Type: Article

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31. This analysis ignores any instrumental factors that depend on the initial photoelectron's kinetic energy. The transmission of the PHI model 550 instrument displays a weak energy dependence over this range (see ref 18, section 5.3). Its inclusion does not affect the relative S to P intensities because of their similar binding energies; however it would affect the predicted intensity ratio of In to S and In to P by 10-40%. For example, inclusion of a strict 1/KE (where KE is the kinetic energy) dependence for the transmission in eq 5 predicts an intensity ratio of 96 - still in reasonable agreement with the experimental value.