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Volumn 15, Issue 5, 1997, Pages 1805-1810

Self-assembled monolayers exposed by metastable argon and metastable helium for neutral atom lithography and atomic beam imaging

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ATOMIC FORCE MICROSCOPY; ATOMS; ELECTRONS; ETCHING; GOLD; HELIUM; LASER APPLICATIONS; LITHOGRAPHY; MASKS; MICROSTRUCTURE; SILICON WAFERS;

EID: 0031219725     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589529     Document Type: Article
Times cited : (57)

References (20)
  • 3
    • 0027910022 scopus 로고
    • G. L. Timp, R. L. Behrenger, D. M. Tennant, J. E. Cunningham, M. Prentiss, and K. K. Berggren, Phys. Rev. Lett. 69, 1636 (1992); J. J. McClelland, R. E. Scholten, E. C. Palm, and R. J. Celotta, Science 262, 877 (1993); K. K. Berggren, M. Prentiss, G. Timp, and R. E. Behringer, J. Opt. Soc. Am. B 11, 1166 (1994).
    • (1993) Science , vol.262 , pp. 877
    • McClelland, J.J.1    Scholten, R.E.2    Palm, E.C.3    Celotta, R.J.4
  • 4
    • 84975607732 scopus 로고
    • G. L. Timp, R. L. Behrenger, D. M. Tennant, J. E. Cunningham, M. Prentiss, and K. K. Berggren, Phys. Rev. Lett. 69, 1636 (1992); J. J. McClelland, R. E. Scholten, E. C. Palm, and R. J. Celotta, Science 262, 877 (1993); K. K. Berggren, M. Prentiss, G. Timp, and R. E. Behringer, J. Opt. Soc. Am. B 11, 1166 (1994).
    • (1994) J. Opt. Soc. Am. B , vol.11 , pp. 1166
    • Berggren, K.K.1    Prentiss, M.2    Timp, G.3    Behringer, R.E.4
  • 12
    • 85087189197 scopus 로고    scopus 로고
    • note
    • 4 Pirahna solution is extremely caustic. Use only with extreme caution.
  • 14
    • 5344224889 scopus 로고    scopus 로고
    • note
    • The uncertainty limits here and throughout this article are one combined standard uncertainty unless otherwise stated.
  • 17
    • 0026866249 scopus 로고
    • S. Schohl, D. Klar, T. Kraft, H. A. I. Meijer, M.-W. Ruf, U. Schmitz, S. J. Smith, and H. Hotop, Z. Phys. D 21, 25 (1991); S. Schohl, H. A. J. Meijer, M. W. Ruf, and H. Hotop, Meas. Sci. Technol. 3, 544 (1992).
    • (1992) Meas. Sci. Technol. , vol.3 , pp. 544
    • Schohl, S.1    Meijer, H.A.J.2    Ruf, M.W.3    Hotop, H.4
  • 18
    • 5344244149 scopus 로고    scopus 로고
    • unpublished results
    • Craig J. Sansonetti (unpublished results).
    • Sansonetti, C.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.