Patterning and functionalizing self-assembled monolayers

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 12 B, 1999, Pages 7260-7263

  Mizutani, Wataru ^a,b  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

Barrier height; Interaction force; Scanning tunneling microscopy; Self assembled monolayer; Work function

Indexed keywords

SCANNING TUNNELING MICROSCOPY;

SELF-ASSEMBLED MONOLAYERS (SAM);

MONOLAYERS;

EID: 0033338596     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.7260     Document Type: Article

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