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Volumn 43, Issue 2 PART 1, 1996, Pages 505-521

TheInfluence of VLSI technology evolution on radiation-induced latchup in space systems

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; COMPUTER SIMULATION; ELECTRIC PROPERTIES; ELECTRON DEVICES; PULSED LASER APPLICATIONS; SPACECRAFT; VLSI CIRCUITS;

EID: 0030127490     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.490897     Document Type: Article
Times cited : (130)

References (69)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.