Neutron-Induced latchup immunity in metal gate cmos integrated circuits

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1769-1774

  Barnes, C E ^a   Rollins, J G ^a   Hachey, D ^b  

^a AEROSPACE CORPORATION   (United States)

^b General Electric Space Center ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84939070644     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337552     Document Type: Article

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