A summary of recent VLSI SEU and latch-up testing

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1992, Pages 12-15

  Kinnison, James D ^a   Maurer, Richard H ^a   McKerracher, Priscilla L ^a   Carkhuff, Bliss G ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMMUNICATION SATELLITES; MICROELECTRONICS; VLSI CIRCUITS;

LATCH-UPS; MICRO-ELECTRONIC DEVICES; SATELLITE SYSTEM; SPACE SYSTEM; TEST SYSTEMS;

RADIATION EFFECTS;

EID: 85064642302     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.1992.247331     Document Type: Conference Paper

References (0)