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Volumn 41, Issue 6, 1994, Pages 2172-2178

Ion-induced sustained high current condition in a bipolar device

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; BINARY CODES; CODE CONVERTERS; COMPUTER AIDED NETWORK ANALYSIS; CYCLOTRONS; ELECTRIC CURRENTS; ELECTRIC POWER SUPPLIES TO APPARATUS; IONS; PHOTOEMISSION; POWER CONTROL; RADIATION EFFECTS; SEMICONDUCTOR DEVICE MODELS;

EID: 0028712009     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340559     Document Type: Article
Times cited : (12)

References (20)
  • 4
  • 5
    • 0024937441 scopus 로고
    • Analysis of latchup-induced photoemission
    • T. Aoki and A. Yoshii, “Analysis of latchup-induced photoemission,” IEEE IEDM Technical Digest, 281–284, 1989.
    • (1989) IEEE IEDM Technical Digest , pp. 281-284
    • Aoki, T.1    Yoshii, A.2
  • 7
    • 0018027179 scopus 로고
    • An investigation of the voltage sustained by epitaxial bipolar transistors in current mode second breakdown
    • L. Dunn and K.I. Nuttall, “An investigation of the voltage sustained by epitaxial bipolar transistors in current mode second breakdown,” International Journal of Electronics, 45, 353, 1978.
    • (1978) International Journal of Electronics , vol.45 , Issue.353
    • Dunn, L.1    Nuttall, K.I.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.