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Volumn 40, Issue 6, 1993, Pages 1947-1951
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Simple model for proton-induced latch-up
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
HIGH ENERGY PHYSICS;
IONS;
MICROELECTRONICS;
PROTONS;
THICKNESS MEASUREMENT;
ANGLE OF INCIDENCE;
HEAVY IONS;
INCIDENT ENERGY;
LINEAR ENERGY TRANSFER;
PROTON INDUCED SINGLE EVENT LATCH UP;
SINGLE EVENT UPSET;
RANDOM ACCESS STORAGE;
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EID: 0027875528
PISSN: 00189499
EISSN: 15581578
Source Type: Journal
DOI: 10.1109/23.273459 Document Type: Article |
Times cited : (19)
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References (8)
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