Future CMOS Scaling and Reliability

Proceedings of the IEEE

Volumn 81, Issue 5, 1993, Pages 682-689

  Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; MOSFET DEVICES; RANDOM ACCESS STORAGE; RELIABILITY;

BUILT-IN RELIABILITY; CMOS SCALING; MOSFET SCALING; SRAM;

CMOS INTEGRATED CIRCUITS;

EID: 0027594079     PISSN: 00189219     EISSN: 15582256     Source Type: Journal    
DOI: 10.1109/5.220900     Document Type: Article

References (16)

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