Overview of device SEE susceptibility from heavy ions

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1993, Pages 1-12

  Nichols, D K ^a   Coss, J R ^a   McCarty, K P ^a   Schwartz, H R ^a   Smith, L S ^a   Swift, G M ^a   Watson, R K ^a   Koga, R ^b   Crain, W R ^b   Crawford, K B ^b   Hansel, S J ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAVY IONS; RADIATION HARDENING;

HEAVY ION SINGLE EVENT EFFECTS; LATCH-UPS; SOFT ERROR; STATE OF THE ART; TEST DATA;

RADIATION EFFECTS;

EID: 0003384051     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.1993.700561     Document Type: Conference Paper

References (9)

1. D. K. Nichols, W. E. Price, W. A. Kolasinski, R. Koga, J. C. Pickel, J. T. Blandford, A. E. Waskiewicz, 'Trends in Parts Susceptibility to Single Event Upset from Heavy Ions, " IEEE Trans. on Nuc. Sci., NS-32 No. 6, 4189 (Dec. 1985)
2. D. K. Nichols, L. S. Smith, W. E. Price, R. Koga, W. A. Kolasinski, "Recent Trends in Parts SEU Susceptibility from Heavy Ions", IEEE Trans on Nuc. Sci., NS-34. No. 6, 1332 (Dec. 1987)
3. D. K. Nichols, L. S. (Ted) Smith, George A. Soli, R. Koga, W. A. Kolasinski, "Latest Trends in Parts SEP Susceptibility from Heavy Ions, " IEEE Trans, on Nuc. Sci., NS-36. No. 6, 2388 (Dec. 1989)
4. D. K. Nichols, L. S. Smith, H. R. Schwartz, G. Soli, K. Watson, R. Koga, W. R. Crain, K. B. Crawford, S. J. Hansel and D. D. Lau, "Update on Parts SEE Susceptibility from Heavy Ions, " IEEE Trans, on Nuc. Sci., NS-38. No. 6, 1529 (Dec. 1991)
5. R. Koga, W. A. Kolasinski, J. V. Osborn, J. H. Elder & R. Chitty, "SEU Test Techniques⋯" IEEE Trans, on Nuc. Sci., NS-35. No. 6. 1638 (Dec. 1988)
6. D. K. Nichols, J. R. Coss, L. S. Smith, B. Rax, M. Huebner, K. Watson, "Full Temperature Characterization of Two Microprocessor Technologies", ibid p 1619 (Dec. 1988)
7. ASTM Designation: F 1192-90, "Standard Guide for the Measurement of SEP Induced by Heavy Ion Irradiation of Semiconductor Devices" ASTM, 1919 Race St, Philadelphia, Pa. 19103
8. R. Koga, W. R. Chin, S. J. Hansel, S. D. Pinkerton, T. K. Tsubota, "The Impact of ASIC Devices on the SEU Vulnerability of Space-Borne Computers", Preprint, IEEE, Trans, on Nuc. Sci., NS-39. No. 6 (Dec. 1992)
9. Vince Sferrino, MIT Lincoln Lab, private communication.