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Volumn , Issue , 1984, Pages 122-127
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PULSED INFRA-RED MICROSCOPY FOR DEBUGGING LATCH-UP ON CMOS PRODUCTS.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS PRODUCTS;
COMPLEMENTARY METAL OXIDE SEMICONDUCTORS;
LATCH UP DEBUGGING;
NEAR INFRARED MICROSCOPY;
RECOMBINATION RADIATION;
SCR LATCH UP;
SOLID STATE DEVICES;
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EID: 0021302991
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/irps.1984.362029 Document Type: Conference Paper |
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Times cited : (26)
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References (0)
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