Parametric Study of Latchup Immunity of Deep Trench-Isolated, Bulk, Nonepitaxial CMOS

IEEE Transactions on Electron Devices

Volumn 39, Issue 4, 1992, Pages 921-931

  Bhattacharya, Suryanarayana ^a   Banerjee, Sanjay K ^a   Lee, Jack C ^a   Tasch, Al F ^a   Chatterjee, Amitava ^b  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; SUBSTRATES;

LATCHUP IMMUNITY; PARAMETRIC DEPENDENCIES;

INTEGRATED CIRCUITS, CMOS;

EID: 0026851062     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.127484     Document Type: Article

References (12)

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