An Observation of Proton-Induced Latchup

IEEE Transactions on Nuclear Science

Volumn 39, Issue 6, 1992, Pages 1654-1656

  Nichols, Donald K ^a   Coss, James R ^a   Kevin Watson, R ^a   Schwartz, Harvey R ^a   Pease, Ronald L ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b MISSION RESEARCH CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 46749131129     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211349     Document Type: Article

References (3)

1. D. K. Nichols, JPL Interoffice Memo No. 514-J-120-86, “SEU Test at Brookhaven, Dec., 1986.”
2. A. H. Johnston and B. W. Hughlock, “Latchup in CMOS from Single Particles,” IEEE Trans. on Nuclear Science, NS-37, No. 6, 1886 (Dec. 1990)
3. W. L. Bendel and E. L. Petersen, “Proton Upsets in Orbit,” IEEE Trans. on Nuclear Science, NS-30, No. 6, 4481 (Dec., 1983)