Seu and latch-up results for SPARC processors

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1993, Pages 13-19

  Estreme, F ^a   Chapuis, T ^a   Velazco, R ^b   Karoui, S ^b   Trigaux, R ^c   Benezech, D Erems ^c   Rosier, L H ^d  

^a CNES   (France)

^b UNIV GRENOBLE ALPES   (France)

^c ZI Flourens ^*  (France)

^d 91405 Orsay Campus   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HEAVY IONS; SPACE APPLICATIONS;

LATCH-UPS;

RADIATION EFFECTS;

EID: 33747755942     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.1993.700562     Document Type: Conference Paper

References (4)

1. R. Velazco, S. Karoui, T. Chapuis, D. Benezech, L. H. Rosier, "Heavy ions test results for the 68020 microprocessor and the 68882 coprocessor", Proceedings RADECS 91, IEEE Catalog number 91TH0400-2, page 445.
2. R. Velazco, S. Karoui, T. Chapuis, "S. E. U. testing of 32-bits microprocessors", 1992 IEEE Transaction on Nuclear Science, IEEE Catalog number 92TH0507-4, page 16.
3. J. Bourrieau, "Irradiation-Total doses-Heavy ions". Spatial Technology Course, Toulouse, France, pages 569-638 (1986).
4. R. HARBOE-SORENSEN, A. T. SUND, "Radiation pre-screnning of R3000/R3000A microprocessors", 1992 IEEE Radiation effects data workshop, IEEE Catalog number 92TH0507-4, page 34.