Infrared Microscopy Study of Anomalous Latchup Characteristics Due to Current Redistribution in Different Parasitic Paths

IEEE Transactions on Electron Devices

Volumn 36, Issue 5, 1989, Pages 969-978

  Canali, Claudio ^a   Corsi, Francesco ^b   Muschitiello, Michele ^c   Zanoni, Enrico ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b UNIVERSITY OF BARI   (Italy)

^c CSATA Centra Studi e Applicazioni Tecnologie Avanzate Tecnopolis ^*  (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES--INFRARED;

ANOMALOUS LATCHUP CHARACTERISTICS; CURRENT REDISTRIBUTION; INFRARED MICROSCOPY; PARASITIC STRUCTURES; SPICE SIMULATION;

INTEGRATED CIRCUITS;

EID: 0024665826     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.299680     Document Type: Article

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